IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and characterization of an active, EMC-dedicated testchip

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Criel, S. ; Bonjean, F. ; De Smedt, R. ; De Langhe, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810177
Regular:

This paper analyzes the radiated EMC-behaviour of integrated circuits. For this purpose, an active EMC testchip has been designed, focusing on some specific topics such as output driver slew-rate... View More

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