IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring the electric and magnetic near fields in VLSI devices

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Slattery, K. ; Wei Cui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810172
Regular:

This paper describes a technique for measurement of high frequency current distributions in microprocessors and other VLSI devices. The technique uses optical precision stepper motors for highly... View More

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