IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation pattern of a PCB based probe intended for near field measurements

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Quilez, M. ; Silva, F. ; Martin, A. ; Fontanilles, J. ; Riu, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810169
Regular:

In some situations, the OATS (open air test site) far field condition cannot be satisfied, and near field measurements must be performed. The EMI environment inside a car is one of these... View More

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