IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-empirical modeling of apertures by use of FDTD

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Martin, T. ; Backstrom, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810128
Regular:

A novel method to include models of complex apertures into the finite-difference time-domain method is presented. Instead of resolving the geometrical details of the aperture, the aperture is... View More

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