IEEE - Institute of Electrical and Electronics Engineers, Inc. - Complications in correlatability between test techniques due to directional emission patterns

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Johnson, D.M. ; Hatfield, M.O. ; Slocum, M.R. ; Freyer, G.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810117
Regular:

Radiated emissions measurements are commonly performed in open area test sites (OATS), anechoic and semi-anechoic chambers, and GTEM and TEM cells. The OATS test results are typically regarded as... View More

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