IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of shield inhomogeneities of multiconductor cables by evaluation of measured transfer impedances and admittances

Proceedings of 1999 International Symposium on Electromagnetic Compatibility (EMC'99)

Author(s): Jung, L. ; Luiken ter Haseborg, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Seattle, WA, USA, USA
Conference Date: 2 August 1999
Volume: 2
ISBN (Paper): 0-7803-5057-X
DOI: 10.1109/ISEMC.1999.810078
Regular:

The determination of the complex transfer impedances and transfer admittances of shielded multiconductor cables is the prerequisite for calculating disturbing currents on the inner wires of the... View More

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