IEEE - Institute of Electrical and Electronics Engineers, Inc. - A unique team model for yield improvement across the fab/sort manufacturing (F/SM) to assembly/test manufacturing (A/TM) divide

1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Author(s): McGovern, E.J. ; Wallace, B. ; Tapp, K.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 October 1999
Page(s): 299 - 302
ISBN (Paper): 0-7803-5403-6
ISSN (Paper): 1523-553X
DOI: 10.1109/ISSM.1999.808795
Regular:

Assembly output is a constraint to Intel's bottom line and manufacturing ramp capability. Fab and Sort contribute to yield loss and throughput time loss within assembly. The... View More

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