IEEE - Institute of Electrical and Electronics Engineers, Inc. - IC performance prediction for test cost reduction

1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Author(s): Jungran Lee ; Walker, D.M.H. ; Milor, L. ; Yeng Peng ; Hill, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 October 1999
Page(s): 111 - 114
ISBN (Paper): 0-7803-5403-6
ISSN (Paper): 1523-553X
DOI: 10.1109/ISSM.1999.808750
Regular:

This paper describes a methodology for building models predicting manufactured integrated circuit performances as a function of inline and wafer electrical test measurements. We show how these... View More

Advertisement