IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance and reliability verification of C6201/C6701 digital signal processors

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Nagaraj, N.S. ; Cano, F. ; Thiruvengadam, S. ; Kapoor, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 521 - 525
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808591
Regular:

Dominance of interconnect parasitics in impacting functionality, performance and reliability in deep sub-micron (DSM) designs is a well known topic. Reduced metal pitches, process variations, new... View More

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