IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line BIST for testing analog circuits

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Velasco-Medina, J. ; Rayane, I. ; Nicolaidis, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 330 - 332
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808563
Regular:

In this paper, we present a new online built-in self-test (BIST) approach for testing analog circuits. It uses a current window comparator and current-based checker circuits for processing the... View More

Advertisement