IEEE - Institute of Electrical and Electronics Engineers, Inc. - An efficient interconnect test using BIST module in a boundary-scan environment

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Hyun Jin Kim ; Jongchul Shin ; Sungho Kang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 328 - 329
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808562
Regular:

In this paper, an efficient built-in self-test (BIST) method for applying tests is developed without collisions of the test data in three-state nets in a system. A new interconnect test algorithm... View More

Advertisement