IEEE - Institute of Electrical and Electronics Engineers, Inc. - An efficient functional coverage test for HDL descriptions at RTL

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Chien-Nan Jimmy Liu ; Jing-Yang Jou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 325 - 327
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808561
Regular:

Until now, simulation has been the primary approach for the functional verification of register transfer level (RTL) circuit descriptions written in a hardware description language (HDL). A finite... View More

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