IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiple paths sensitization of digital oscillation built-in self test

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Dufaza, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 166 - 174
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808422
Regular:

Digital oscillation built-in self test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in... View More

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