IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new weight set generation algorithm for weighted random pattern generation

Proceedings. 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD'99

Author(s): Hangkyu Lee ; Sungho Kang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 10 October 1999
Page(s): 160 - 165
ISBN (Paper): 0-7695-0406-X
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.1999.808421
Regular:

In weighted random pattern testing based on deterministic test patterns, if the number of the deterministic test patterns with a low sampling probability is reduced, the number of the weighted... View More

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