IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current ratios: a self-scaling technique for production I/sub DDQ/ testing

Proceedings of IEEE Computer Society International Test Conference (ICSM'99)

Author(s): Maxwell, P. ; O'Neill, P. ; Aitken, R. ; Dudley, R. ; Jaarsma, N. ; Quach, M. ; Wiseman, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Atlantic City, NJ, USA, USA
Conference Date: 30 September 1999
Page(s): 738 - 746
ISBN (Paper): 0-7803-5753-1
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1999.805803
Regular:

The use of a single pass/fail threshold for I/sub DDQ/ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describes a method... View More

Advertisement