IEEE - Institute of Electrical and Electronics Engineers, Inc. - Confidence Limits for System Reliability: A Sequential Method

Author(s): Alan Winterbottom ; John L. Verrall
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1971
Volume: R-20
Page(s): 204 - 211
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1971.5216137
Regular:

A sequential method is given for obtaining confidence limits for system reliability when ``pass-fail'' test data have been obtained on components. Costs of testing are examined and a rule is... View More

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