IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1.5 volts Iddq/Iddt current monitor
Engineering Solutions for the Next Millennium. 1999 IEEE Canadian Conference on Electrical and Computer Engineering
Author(s): | Pecuh, I. ; Margala, M. ; Stopjakova, V. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 1999 |
Conference Location: | Edmonton, Alberta, Canada, Canada |
Conference Date: | 9 May 1999 |
Volume: | 1 |
ISBN (Paper): | 0-7803-5579-2 |
ISSN (Paper): | 0840-7789 |
DOI: | 10.1109/CCECE.1999.807244 |
Regular:
A built-in current monitor for low-voltage digital CMOS circuits is presented. The monitor is designed for quiescent current testing (Iddq) and transient current testing (Iddt). Negligible effect... View More