IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1.5 volts Iddq/Iddt current monitor

Engineering Solutions for the Next Millennium. 1999 IEEE Canadian Conference on Electrical and Computer Engineering

Author(s): Pecuh, I. ; Margala, M. ; Stopjakova, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Edmonton, Alberta, Canada, Canada
Conference Date: 9 May 1999
Volume: 1
ISBN (Paper): 0-7803-5579-2
ISSN (Paper): 0840-7789
DOI: 10.1109/CCECE.1999.807244
Regular:

A built-in current monitor for low-voltage digital CMOS circuits is presented. The monitor is designed for quiescent current testing (Iddq) and transient current testing (Iddt). Negligible effect... View More

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