IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semiconductor controlled rectifier (SCR) electrostatic discharge (ESD) protection devices in submicron CMOS technology

Engineering Solutions for the Next Millennium. 1999 IEEE Canadian Conference on Electrical and Computer Engineering

Author(s): Lee, J. ; Syrzycki, M. ; Iniewski, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Edmonton, Alberta, Canada, Canada
Conference Date: 9 May 1999
Volume: 1
ISBN (Paper): 0-7803-5579-2
ISSN (Paper): 0840-7789
DOI: 10.1109/CCECE.1999.807233
Regular:

Multiple designs of silicon controlled rectifier (SCR) devices as major electrostatic discharge (ESD) protection circuits in 0.35 micron CMOS technology are investigated to provide better insight... View More

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