IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comparative analysis of high-speed digital test techniques

Engineering Solutions for the Next Millennium. 1999 IEEE Canadian Conference on Electrical and Computer Engineering

Author(s): Sachdev, M. ; Shashaani, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Edmonton, Alberta, Canada, Canada
Conference Date: 9 May 1999
Volume: 1
ISBN (Paper): 0-7803-5579-2
ISSN (Paper): 0840-7789
DOI: 10.1109/CCECE.1999.807228
Regular:

Testing of high performance integrated circuits is becoming increasingly a challenging task owing to higher clock frequencies and non availability/economical of VLSI testers. We outline a... View More

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