IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling and parameter extraction of BJT substrate resistance

Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting

Author(s): Tzung-Yin Lee ; Fox, R.M. ; Green, K. ; Vrotsos, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Minneapolis, MN, USA
Conference Date: 28 September 1999
Page(s): 101 - 104
ISBN (Paper): 0-7803-5712-4
ISSN (Paper): 1088-5714-0
DOI: 10.1109/BIPOL.1999.803536
Regular:

This paper presents an efficient method to account for the layout dependent substrate resistance for bipolar transistors. The method enables a single set of parameters to fit for all the identical... View More

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