IEEE - Institute of Electrical and Electronics Engineers, Inc. - Flashover behavior of semiconducting glazed insulators under positive switching impulse stress at different climatic conditions

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Elsasser, O. ; Feser, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
Volume: 2
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.807904
Regular:

This paper deals with the flashover voltage of semiconducting glazed insulators under positive switching impulse stress. The measurements are carried out with clean insulators. The results are... View More

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