IEEE - Institute of Electrical and Electronics Engineers, Inc. - Chemical analysis of the surface of silicone rubber using X-ray photoelectron spectroscopy

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Nishioka, H. ; Arise, N. ; Okraku-Yirenkyi, Y. ; Otsubo, M. ; Takenouchi, O. ; Honda, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
Volume: 2
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.807901
Regular:

This paper describes the experimental results of accelerated aging tests under two different types of experimental conditions. The changes in chemical structure and hydrophobicity of silicone... View More

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