IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of aged distribution terminations by characterization techniques

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Jae Hong Han ; Byung Sung Lee ; Yong Heui Han
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
Volume: 2
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.807899
Regular:

This study describes the reliability assessment of 13 years service-aged distribution terminations using characterization techniques such as SEM, ESCG DSC/OIT, FTIR, NMR and so on.... View More

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