IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combined electroluminescence and charge profile measurements in polyethylene naphthalate

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Auge, J.L. ; Teyssedre, G. ; Laurent, C. ; Ditchi, T. ; Hole, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
Volume: 2
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.807849
Regular:

Under DC stress, electroluminescence in polyethylene naphthalate films is stable, current-proportional, above a threshold field of 150 kV/mm. At this field level, the luminescence is... View More

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