IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitivity of a microwave differential technique for the measurement of contaminants in gases

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Rouleau, J.F. ; Goyette, J. ; Bose, T.K. ; Frechette, M.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.804675
Regular:

A resonant-cavity based microwave differential technique has been developed for the detection of humidity in a gas in the low-ppm range. The determination of the contaminant content is related to... View More

Advertisement