IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pulse-sequence-analysis-chances to characterize defects

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Patsch, R. ; Berton, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.804636
Regular:

Partial discharge data are often used to get information about the ageing situation of high voltage equipment. Local defects generate characteristic sequences of partial discharges that also... View More

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