IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of probe geometry on the response of an electrostatic probe

Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Johansson, T. ; Crichton, G.C. ; McAllister, I.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Austin, TX, USA, USA
Conference Date: 17 October 1999
ISBN (Paper): 0-7803-5414-1
DOI: 10.1109/CEIDP.1999.804610
Regular:

The response of an electrostatic probe is examined with reference to the probe geometry. The study involves the evaluation of the probe /spl lambda/ function, from which response-related... View More

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