IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 3D scanning system based on low-occlusion approach

Second International Conference on 3-D Digital Imaging and Modeling

Author(s): Bor-Tow Chen ; Wen-Shiou Lou ; Chia-Chen Chen ; Hsien-Chang Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Ottawa, Ontario, Canada, Canada
Conference Date: 8 October 1999
Page(s): 506 - 515
ISBN (Paper): 0-7695-0062-5
DOI: 10.1109/IM.1999.805383
Regular:

In order to enhance the performance of a 3D laser scanning system, a low occlusion approach is analyzed to find the best view for scanning by considering the object position instead of the sensor... View More

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