IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new BIST architecture for low power circuits

European Test Workshop 1999

Author(s): Corno, F. ; Rebaudengo, M. ; Reorda, M.S. ; Violante, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Constance, Germany, Germany
Conference Date: 25 May 1999
Page(s): 160 - 164
ISBN (Paper): 0-7695-0390-X
DOI: 10.1109/ETW.1999.804523
Regular:

In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode. During test application the circuits are... View More

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