IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of an automatic testing for FPGAs

European Test Workshop 1999

Author(s): Doumar, A. ; Ohmameuda, T. ; Ito, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Constance, Germany, Germany
Conference Date: 25 May 1999
Page(s): 152 - 157
ISBN (Paper): 0-7695-0390-X
DOI: 10.1109/ETW.1999.804522
Regular:

This paper presents a new design for testing SRAM-based field programmable gate arrays (FPGAs). The original SRAM part is modified a bit so that the FPGA gets the ability to automatically shift... View More

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