IEEE - Institute of Electrical and Electronics Engineers, Inc. - From system level to defect-oriented test: a case study

European Test Workshop 1999

Author(s): Dias, O.P. ; Semiao, J. ; Santos, M.B. ; Teixeira, I.M. ; Teixeira, J.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Constance, Germany, Germany
Conference Date: 25 May 1999
Page(s): 136 - 141
ISBN (Paper): 0-7695-0390-X
DOI: 10.1109/ETW.1999.804509
Regular:

The purpose of this paper is to demonstrate the usefulness of a recently proposed Object-Oriented (OO) based methodology and tools (SysObj and Test-Adder) when applied in the design of testable... View More

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