IEEE - Institute of Electrical and Electronics Engineers, Inc. - Elevating interface device design in the test program set development process

1999 IEEE AUTOTESTCON Proceedings

Author(s): Freeman, R. ; Shoopman, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Antonio, TX, USA, USA
Conference Date: 30 August 1999
Page(s): 253 - 258
ISBN (Paper): 0-7803-5432-X
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.1999.800387
Regular:

This paper describes a Test Program Set (TPS) Interface Device development process which will improve signal performance, lower cost, and enhance maintainability. Hardware is designed as modular... View More

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