IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated testing of high speed high resolution, A to D converters

1999 IEEE AUTOTESTCON Proceedings

Author(s): Kings, C. ; Mumford, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Antonio, TX, USA, USA
Conference Date: 30 August 1999
Page(s): 235 - 242
ISBN (Paper): 0-7803-5432-X
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.1999.800385
Regular:

This paper describes an automated test set designed and built to test a 14 bit, 5.2 MHz A/D using a sinusoidal input. The familiar transfer function plots for integral nonlinearity are obtained by... View More

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