IEEE - Institute of Electrical and Electronics Engineers, Inc. - New ISNs for emission and immunity testing on unshielded telecommunication ports

Proceedings of 4th International Symposium on Electromagnetic Compatability

Author(s): Stecher, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Tokyo, Japan, Japan
Conference Date: 17 May 1999
ISBN (Paper): 4-9980748-4-9
DOI: 10.1109/ELMAGC.1999.801448
Regular:

The new editions of CISPR 22/EN 55022 as well as CISPR 24/EN 55024 require testing of emission and immunity on telecommunication ports of information technology equipment (ITE) and... View More

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