IEEE - Institute of Electrical and Electronics Engineers, Inc. - An EMI test methodology for network devices

Proceedings of 4th International Symposium on Electromagnetic Compatability

Author(s): Chang, Y.C. ; Chen, F. ; Liau, P.Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Tokyo, Japan, Japan
Conference Date: 17 May 1999
Page(s): 662 - 665
ISBN (Paper): 4-9980748-4-9
DOI: 10.1109/ELMAGC.1999.801415
Regular:

A series of EMI tests for network devices were designed and completed The frequency ranged from 30 to 900 MHz with an increment of 10 MHz. Three EUT exposure cable configurations were applied to... View More

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