IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deterioration in shield characteristics by signal lines and power lines passing through shield material

Proceedings of 4th International Symposium on Electromagnetic Compatability

Author(s): Miyazaki, C. ; Oka, N. ; Uchida, T. ; Fukasawa, T. ; Nitta, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Tokyo, Japan, Japan
Conference Date: 17 May 1999
Page(s): 520 - 523
ISBN (Paper): 4-9980748-4-9
DOI: 10.1109/ELMAGC.1999.801379
Regular:

The authors are developing the technology for designing shields of electronic equipment. As a factor which deteriorates shield characteristics, we pay attention to signal lines and power lines... View More

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