IEEE - Institute of Electrical and Electronics Engineers, Inc. - Very fast time domain measurement of voltage rising part due to micro gap discharge in air

Proceedings of 4th International Symposium on Electromagnetic Compatability

Author(s): Kawamata, K. ; Minegishi, S. ; Haga, A. ; Sato, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Tokyo, Japan, Japan
Conference Date: 17 May 1999
Page(s): 118 - 121
ISBN (Paper): 4-9980748-4-9
DOI: 10.1109/ELMAGC.1999.801277
Regular:

Voltage rise and fall characteristics due to starting of very short gap discharge were investigated in time domain. The gap space was set very short for voltage below 1500 V as phenomena of CDM... View More

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