IEEE - Institute of Electrical and Electronics Engineers, Inc. - Immunity testing of computerized equipment to fast electrical transients using adaptive test methods

Proceedings of 4th International Symposium on Electromagnetic Compatability

Author(s): Wendsche, S. ; Vick, R. ; Habiger, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Tokyo, Japan, Japan
Conference Date: 17 May 1999
Page(s): 82 - 85
ISBN (Paper): 4-9980748-4-9
DOI: 10.1109/ELMAGC.1999.801268
Regular:

One of the major problems associated with testing computerized equipment for immunity, stems from the fact that their susceptibility to electrical transients is time-variant. This paper develops... View More

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