IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of using adaptive body bias to compensate die-to-die Vt variation on within-die Vt variation

Proceedings. 1999 International Symposium on Low Power Electronics and Design

Author(s): Narendra, S. ; Antoniadis, D. ; De, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Diego, CA, USA, USA
Conference Date: 17 August 1999
Page(s): 229 - 232
ISBN (Paper): 1-58113-133-X
Regular:

Scaling of supply voltage (Vdd) is essential for controlling active power dissipation in complex digital circuits. Transistor threshold voltage (Vt) variation is one of the key limiters to Vdd... View More

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