IEEE - Institute of Electrical and Electronics Engineers, Inc. - A sampling weak-program method to tighten Vth-distribution of 0.5 V for low-voltage flash memories

1999 Symposium on VLSI Circuits. Digest of Technical Papers

Author(s): H. Shiga ; T. Tanzawa ; A. Umezawa ; T. Taura ; T. Miyaba ; M. Saito ; S. Kitamura ; S. Mori ; S. Atsumi
Sponsor(s): Japan Soc. Appl. Phys.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Kyoto, Japan, Japan
Conference Date: 17 June 1999
Page Count: 4
Page(s): 33 - 36
ISBN (Paper): 4-930813-95-6
DOI: 10.1109/VLSIC.1999.797226
Regular:

Recently, it has become increasingly important to lower the supply voltage of fast access time NOR flash EEPROMs for a low power handheld digital equipment. In order to scale the boosted word-line... View More

Advertisement