IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improvement on component stresses of single-stage electronic ballasts

Proceedings of 34th Annual Meeting of the IEEE Industry Applications

Author(s): Wu, T.-F. ; Lee, C.-Y. ; Wu, Y.-J. ; Su, J.-Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Phoenix, AZ, USA, USA
Conference Date: 3 October 1999
Volume: 1
ISBN (Paper): 0-7803-5589-X
ISSN (Paper): 0197-2618
DOI: 10.1109/IAS.1999.799969
Regular:

This paper presents an improvement on component stresses of single-stage electronic ballasts derived with synchronous switch technique (SST). Based on the SST, the derivation of a single-stage... View More

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