IEEE - Institute of Electrical and Electronics Engineers, Inc. - Behavior of excess electrons in supercritical fluids-electron attachment

Proceedings of 1999 IEEE 13th International Conference on Dielectric Liquids. (ICDL '99)

Author(s): Nishikawa, M. ; Holroyd, R.A. ; Itoh, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Nara, Japan, Japan
Conference Date: 25 July 1999
Page(s): 9 - 12
ISBN (Paper): 0-7803-4759-5
DOI: 10.1109/ICDL.1999.798855
Regular:

The behavior of excess electrons in supercritical ethane was investigated by measuring mobility and reaction rates. Mobilities were measured by means of a time-of-flight method at 306-320 K as a... View More

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