IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thin edge detector

Proceedings of ICIAP '99 - 10th International Conference on Image Analysis and Processing

Author(s): Trujillo, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Venice, Italy, Italy
Conference Date: 27 September 1999
Page(s): 1,051 - 1,054
ISBN (Paper): 0-7695-0040-4
DOI: 10.1109/ICIAP.1999.797736
Regular:

Most edge detectors are based on detecting points in the image with a high gradient value. However, in general, they omit the idea that the edge must be a connected line of pixels. Instead of... View More

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