IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic generation of significant and local feature groups of complex and deformed objects

Proceedings of ICIAP '99 - 10th International Conference on Image Analysis and Processing

Author(s): Pechtel, D. ; Kuhnert, K.-D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Venice, Italy, Italy
Conference Date: 27 September 1999
Page(s): 340 - 345
ISBN (Paper): 0-7695-0040-4
DOI: 10.1109/ICIAP.1999.797618
Regular:

Automatic generation of significant feature groups out of a given set of basic features, i.e., creation of abstract characteristics, is a fundamental problem to be solved in pattern recognition.... View More

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