IEEE - Institute of Electrical and Electronics Engineers, Inc. - Micro IDDQ test using Lorentz force MOSFET's

1999 Symposium on VLSI Technology. Digest of Technical Papers

Author(s): K. Nose ; T. Sakurai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Kyoto, Japan, Japan
Conference Date: 14 June 1999
Page Count: 2
Page(s): 167 - 168
ISBN (Paper): 4-930813-93-X
DOI: 10.1109/VLSIT.1999.799396
Regular:

Recently, the number of transistors in VLSIs has increased rapidly, which makes it difficult to find the locations of design errors and/or the locations of small circuit/process margins. The most... View More

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