IEEE - Institute of Electrical and Electronics Engineers, Inc. - Alpha-SER modeling and simulation for sub-0.25 /spl mu/m CMOS technology

1999 Symposium on VLSI Technology. Digest of Technical Papers

Author(s): Changhong Dai ; S. Hareland ; J. Maiz ; Shiuh-Wuu Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Kyoto, Japan, Japan
Conference Date: 14 June 1999
Page Count: 2
Page(s): 81 - 82
ISBN (Paper): 4-930813-93-X
DOI: 10.1109/VLSIT.1999.799350
Regular:

Soft errors (single event upset) due to alpha particles from radioactive impurities in packaging materials were first observed on DRAMs. While terrestrial cosmic rays also cause soft errors and... View More

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