IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic edge detection of DNA bands in autoradiograph images

Proceedings of ISIE '99. IEEE International Symposium on Industrial Electronics

Author(s): Khashman, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Bled, Slovenia, Slovenia
Conference Date: 12 July 1999
Volume: 3
ISBN (Paper): 0-7803-5662-4
DOI: 10.1109/ISIE.1999.796864
Regular:

Scale space analysis is an efficient solution to the edge detection of objects in low to high contrast images. However, this approach is time consuming and computationally expensive. The parallel... View More

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