IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tutorial: characterizing SDRAMs

1999 IEEE International Workshop on Memory Technology, Design and Testing

Author(s): Voilrath, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Jose, CA, USA, USA
Conference Date: 9 August 1999
Page(s): 62 - 69
ISBN (Paper): 0-7695-0259-8
ISSN (Paper): 1087-4852
DOI: 10.1109/MTDT.1999.782685
Regular:

This paper presents characterization methods for an SDRAM in a manufacturing environment. Contact tests, dc tests, basic functional tests, signal margin tests and retention characterization are... View More

Advertisement