IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new modeling and simulation capability for statistical analysis of the radiation hardness of integrated circuits

Proceedings of the Thirteenth Biennial University/Government/Industry Microelectronics Symposium

Author(s): Hess, G.T. ; Sanders, T.J. ; Means, D.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Minneapolis, MN, USA
Conference Date: 23 June 1999
Page(s): 196 - 199
ISBN (Paper): 0-7803-5240-8
ISSN (Paper): 0749-6877
DOI: 10.1109/UGIM.1999.782852
Regular:

An engineering-based model has been developed that statistically simulates the effects of radiation on integrated circuits. Prototype software has been developed that facilitates these simulations... View More

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