IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated phase noise measurement of Ku-band MMIC VCO on-wafer

1999 IEEE MTT-S International Microwave Symposium Digest

Author(s): J.M. Yang ; D.C. Yang ; P.G. Cheng ; J.M. Dickson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Anaheim, CA, USA, USA
Conference Date: 13 June 1999
Volume: 4
Page Count: 4
ISBN (Paper): 0-7803-5135-5
DOI: 10.1109/MWSYM.1999.780313
Regular:

Voltage-controlled-oscillators (VCOs) are often used as low cost frequency sources in mmW transceivers. We have found that it is feasible to rapidly determine the phase noise of Ku-band... View More

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